雷射奈米粒徑與Zeta電位分析儀
Nano Particle Size and Zeta Potential Analyzer
奈米粒徑與Zeta電位分析儀Treksizer Nano 90 Zeta，具有高靈敏度、高精確度之特性，可測量粒徑與Zeta電位，是測量奈米顆粒的最佳設備。
- 使用動態光散射法(D.L.S)分析奈米粒徑
- 藉由電泳光散射法(E.L.S)分析Zeta 電位
- 藉由靜態光散射法(S.L.S)分析絕對分子量
- 採用大功率的雷射光光源和高靈敏度的APD
- 具有精密的溫控系統
儀器規格如下表，需詳細資料請洽詢本公司
Particle size Measurement | |
粒徑量測範圍Size range(DH) | 0.3nm~15um* |
樣品最小體積Mini. Sample volume | 3uL* |
偵測器角度Detector Angle | 90° |
分析模式Analysis Algorithm | Cumulants, Universal Modem CONTIN |
Zeta potemtial Measurement | |
偵測器角度Detector Angle | 12° |
界面電位量測範圍Zeta potential range | No actual limitation |
電泳移動率範圍Electophoretic Mobility Range | > ±20 μ.cm/V.s |
導電度範圍Conductivity Range | 260 mS/cm* |
樣品最小體積Mini Sample volume | 0.75mL |
Molecular weight Measurement | |
絕對分子量量測範圍Molecular weight range | 342 Da – 2 x 107 Da* |
Viscosity Measurement | |
樣品黏度範圍viscosity range | 0.01cp~100cp* |
Interaction Parameter | |
KD | No actual limitation |
Trend Measurement | |
量測模式Mode | Time |
System Parameters | |
溫度控制範圍Temperature control | -10℃~~110℃±0.1℃ |
冷凝控制Condensation Control | Dry air or nitrogen |
標準雷射光光源Standard Laser Source | 50 mW Solid-state laser, 671 nm |
偵測器Detector | APD(avalanche photodiode) |
光強控制Intensity Control | 0.0001%~100%, manual or automatic |
Optional | |
Dispsable micro volume cuvette(40uL~70uL) | |
Micro- volume glass cuvette (25uL~50uL) | |
Glass cuvette with round opening (1mL~1.5mL) | |
Dip cell kit(1mL~1.5mL,zeta potential measurement for organic samples) | |
*Depending on samples and accessories | |
